Fredrik Ingvarson

Visar 33 publikationer

2007

A Compact Resistance Model of an Array of Substrate Contacts for Applications in Noise Coupling Analysis

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson
Swedish System on Chip Conference
Övrigt konferensbidrag
2007

Evaluation of Using Active Circuitry for Substrate Noise Suppression

Rashid Farivar, Simon Kristiansson, Fredrik Ingvarson et al
ACM Great Lakes Symposium on VLSI (GLSVLSI), p. 449-452
Paper i proceeding
2007

Evaluation of Active Cancellation of Substrate-Noise in Mixed-Signal ICs

Zargham Baghchehsaraei, Simon Kristiansson, Fredrik Ingvarson et al
IEEE Norchip Conference. Vol. 2007
Paper i proceeding
2007

Compact Spreading Resistance Model for Rectangular Contacts on Uniform and Epitaxial Substrates

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson
IEEE Transactions on Electron Devices. Vol. 54 (9), p. 2531-2536
Artikel i vetenskaplig tidskrift
2006

Substrate Noise Reduction Using Active Circuitry

Rashid Farivar, Simon Kristiansson, Fredrik Ingvarson et al
Swedish System on Chip Conference
Övrigt konferensbidrag
2006

A High-Frequency Extension of a Surface-Potential-Based Substrate Model for Noise Coupling Analysis

Nebojsa Simic, Fredrik Ingvarson, Simon Kristiansson et al
International Conference on Microelectronics
Artikel i vetenskaplig tidskrift
2006

Properties and Modeling of Ground Structures for Reducing Substrate Noise Coupling in ICs

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson
IEEE International Symposium on Circuits and Systems
Paper i proceeding
2005

A comparison of the exact and an approximate solution for the resistance between two coplanar circular discs

Simon Kristiansson, Shiva P. Kagganti, Fredrik Ingvarson et al
Solid-State Electronics. Vol. 49 (2), p. 275-277
Artikel i vetenskaplig tidskrift
2005

Modeling of Rectangular Contacts for Noise Coupling Analysis in Homogeneous Substrates

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson
23rd Norchip Conference, Oulu, Finland
Paper i proceeding
2005

A Surface Potential Model for Predicting Substrate Noise Coupling in Integrated Circuits

Simon Kristiansson, Fredrik Ingvarson, Shiva P. Kagganti et al
IEEE Journal of Solid-State Circuits. Vol. 40 (9), p. 1797-1803
Artikel i vetenskaplig tidskrift
2005

Influence of Guard Bands on Substrate Noise Coupling

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson
Proceedings of the Swedish System-on-Chip Conference 2005
Övrigt konferensbidrag
2004

An empirical table based HBT large signal model

Iltcho Angelov, Dominique Schreurs, Kristoffer Andersson et al
34th European Microwave Conference. Vol. 1, p. 229-232
Paper i proceeding
2004

A Surface Potential Model for Predicting Substrate Noise Coupling in Integrated Circuits

Simon Kristiansson, Fredrik Ingvarson, Shiva P. Kagganti et al
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC; Orlando, FL; United States; 3 October 2004 through 6 October 2004, p. 497-500
Paper i proceeding
2004

Resistance Modeling in 1D, 2D, and 3D for Substrate Networks

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al
Physica Scripta. Vol. T114, p. 217-222
Artikel i vetenskaplig tidskrift
2003

Resistance Modelling in 1D, 2D, and 3D for Substrate Networks

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al
Nordic Semiconductor Meeting, Tampere, Finland
Paper i proceeding
2003

Substrate Resistance Modeling for Noise Coupling Analysis

Simon Kristiansson, Shiva P. Kagganti, Ewert Tony et al
International Conference on Microelectronics Test Structures, Monterey, California, USA
Paper i proceeding
2003

Substrate Resistance Modelling in One, Two and Three Dimensions

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al
Swedish System-on-Chip Conference, Eskilstuna
Övrigt konferensbidrag
2003

CMOS large signal model for CAD

Iltcho Angelov, Mattias Ferndahl, Fredrik Ingvarson et al
2003 IEEE MTT-S International Microwave Symposium Digest. Vol. 2, p. 643-646
Paper i proceeding
2003

An Accurate Pi Resistor Network for Substrate Coupling Estimation

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al
21st Norchip Conference, Riga, Latvia
Paper i proceeding
2003

Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model

Fredrik Ingvarson, Martin Linder, Kjell Jeppson
IEEE Transactions on Semiconductor Manufacturing. Vol. 16 (2), p. 228-232
Artikel i vetenskaplig tidskrift
2003

90-nm CMOS for microwave power applications

Mattias Ferndahl, Hans-Olof Vickes, Herbert Zirath et al
IEEE Microwave and Wireless Components Letters. Vol. 13 (12), p. 523-525
Artikel i vetenskaplig tidskrift
2002

Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model

Fredrik Ingvarson, Martin Linder, Kjell Jeppson
Proceedings of the 2002 IEEE International Conference on Microelectronic Test Structures, p. 71-75
Paper i proceeding
2001

A new test structure for parasitic resistance extraction in bipolar transistors

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al
Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, p. 25-30
Paper i proceeding
2001

A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure

Fredrik Ingvarson, Martin Linder, Kjell Jeppson et al
Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, p. 31-36
Paper i proceeding
2000

Extraction of the intrinsic base region sheet resistance in bipolar transistors

Fredrik Ingvarson, Martin Linder, Kjell Jeppson et al
Proceedings of the 2000 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, p. 184-186
Paper i proceeding
2000

On DC modeling of the base resistance in bipolar transistors

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al
Solid-State Electronics. Vol. 44 (8), p. 1411-1418
Artikel i vetenskaplig tidskrift
2000

Extraction of emitter and base series resistances of bipolar transistors from a single DC measurement

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al
IEEE Transactions on Semiconductor Manufacturing. Vol. 13 (2), p. 119-126
Artikel i vetenskaplig tidskrift
1999

A new procedure for extraction of series resistances for bipolar transistors from DC measurements

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al
Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, p. 147-151
Paper i proceeding
1999

Stress and recovery transients in bipolar transistors and MOS structures

Fredrik Ingvarson, Lars-Åke Ragnarsson, Per Lundgren et al
Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, p. 173-178
Paper i proceeding
1998

A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

Fredrik Ingvarson, Kjell Jeppson
Proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, p. 159-164
Paper i proceeding
1998

Parameter extraction for bipolar transistors

Fredrik Ingvarson, Kjell Jeppson
Microelectronic Engineering. Vol. 40 (3-4), p. 187-94
Artikel i vetenskaplig tidskrift

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