Characterisation of bipolar transistors : parameter extraction and degradation dynamics
Licentiatavhandling, 1998

bipolar junction transistor

reverse-bias stress

early effect

Gummel-Poon transistor model

recovery dynamics

parameter extraction

stress dynamics

direct extraction

current gain degradation

series resistance extraction

Författare

Fredrik Ingvarson

Institutionen för mikroelektronik

Ämneskategorier

Annan elektroteknik och elektronik

ISBN

91-7197-722-8

Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 294