Characterisation of bipolar transistors : parameter extraction and degradation dynamics
Licentiatavhandling, 1998
bipolar junction transistor
reverse-bias stress
early effect
Gummel-Poon transistor model
recovery dynamics
parameter extraction
stress dynamics
direct extraction
current gain degradation
series resistance extraction
Författare
Fredrik Ingvarson
Institutionen för mikroelektronik
Ämneskategorier
Annan elektroteknik och elektronik
ISBN
91-7197-722-8
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 294