Characterisation of bipolar transistors : parameter extraction and degradation dynamics
Licentiatavhandling, 1998
bipolar junction transistor
reverse-bias stress
early effect
Gummel-Poon transistor model
recovery dynamics
parameter extraction
stress dynamics
direct extraction
current gain degradation
series resistance extraction
Författare
Fredrik Ingvarson
Institutionen för mikroelektronik
Ämneskategorier (SSIF 2011)
Annan elektroteknik och elektronik
ISBN
91-7197-722-8
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 294