A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters
Paper in proceedings, 1998

Author

Fredrik Ingvarson

Department of Solid State Electronics

Kjell Jeppson

Department of Solid State Electronics

Proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures

159-164

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017