A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure
Paper in proceedings, 2001

Author

Fredrik Ingvarson

Department of Microelectronics and Nanoscience

Martin Linder

Kjell Jeppson

Department of Microelectronics and Nanoscience

Shi-Li Zhang

Jan Grahn

Mikael Östling

Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures

31-36

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017