A new procedure for extraction of series resistances for bipolar transistors from DC measurements
Paper in proceedings, 1999

Author

Martin Linder

Fredrik Ingvarson

Department of Microelectronics, Solid State Electronics

Kjell Jeppson

Department of Microelectronics, Solid State Electronics

Jan Grahn

Shi-Li Zhang

Mikael Östling

Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures

147-151

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017