A new procedure for extraction of series resistances for bipolar transistors from DC measurements
Paper in proceeding, 1999
Author
Martin Linder
Fredrik Ingvarson
Department of Microelectronics, Solid State Electronics
Kjell Jeppson
Department of Microelectronics, Solid State Electronics
Jan Grahn
Shi-Li Zhang
Mikael Östling
Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures
147-151
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering