Stress and recovery transients in bipolar transistors and MOS structures
Paper in proceedings, 1999

Author

Fredrik Ingvarson

Department of Microelectronics

Lars-Åke Ragnarsson

Department of Microelectronics

Per Lundgren

Department of Microelectronics

Kjell Jeppson

Department of Microelectronics

Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures

173-178

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017