Stress and recovery transients in bipolar transistors and MOS structures
Paper in proceeding, 1999

Author

Fredrik Ingvarson

Department of Microelectronics

Other publications Research

Lars-Åke Ragnarsson

Department of Microelectronics

Per Lundgren

Department of Microelectronics

Other publications Research

Kjell Jeppson

Department of Microelectronics

Other publications Research

Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures

173-178

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017

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