Extraction of the intrinsic base region sheet resistance in bipolar transistors
Paper in proceedings, 2000

Author

Fredrik Ingvarson

Department of Microelectronics

Martin Linder

Kjell Jeppson

Department of Microelectronics

Shi-Li Zhang

Jan Grahn

Mikael Östling

Proceedings of the 2000 IEEE Bipolar/BiCMOS Circuits and Technology Meeting

184-186

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017