A new test structure for parasitic resistance extraction in bipolar transistors
Paper in proceeding, 2001
Author
Martin Linder
Fredrik Ingvarson
Department of Microelectronics and Nanoscience
Kjell Jeppson
Department of Microelectronics and Nanoscience
Shi-Li Zhang
Jan Grahn
Mikael Östling
Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures
25-30
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering