A new test structure for parasitic resistance extraction in bipolar transistors
Paper in proceedings, 2001

Author

Martin Linder

Fredrik Ingvarson

Department of Microelectronics and Nanoscience

Kjell Jeppson

Department of Microelectronics and Nanoscience

Shi-Li Zhang

Jan Grahn

Mikael Östling

Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures

25-30

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017