PC2: Identifying noise processes in superconducting resonators
Paper in proceeding, 2013
Extensive studies of dielectric loss due to two level fluctuators (TLFs) in superconducting resonators have provided routes for low loss resonators. The research is motivated not only by the use of resonators as detectors and in quantum information processing, but more generally due to TLFs being a source of noise and decoherence in all quantum devices. In this work a frequency locked loop was used to measure frequency fluctuations at timescales in excess of 104 seconds, thereby accurately probing the TLF induced low- frequency noise of the resonator. Our measurement method lead to very high statistical confidence even for very long timescales, and here we can therefore present results explicitly identifying power dependent flicker frequency noise (S = 1/fa where a=1) persisting down to the mHz level.
Two level fluctuators
superconducting device
1/f noise
Author
J. Burnett
Royal Holloway University of London
National Physical Laboratory (NPL)
Tobias Lindström
National Physical Laboratory (NPL)
I. Wisby
Royal Holloway University of London
National Physical Laboratory (NPL)
Sebastian Erik de Graaf
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Astghik Adamyan
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Andrey Danilov
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Sergey Kubatkin
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
Philip J. Meeson
Royal Holloway University of London
A.Y. Tzalenchuk
National Physical Laboratory (NPL)
Royal Holloway University of London
2013 IEEE 14th InternationalSuperconductive Electronics Conference, ISEC 2013
Art. no. 6604284-
9781467363716 (ISBN)
Subject Categories
Physical Sciences
DOI
10.1109/ISEC.2013.6604284
ISBN
9781467363716