Preparation of TEM specimens from fragile oxide films using focused ion beam (FIB)
Journal article, 2002

Author

Johan Angenete

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

Other publications Research

Krystyna Marta Stiller

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

Other publications Research

Henrik Svensson

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

15th International Congress on Electron Microscopy (ICEM-15)

Subject Categories

Materials Engineering

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12/13/2018

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