TEM investigation on stress contrast and interfaces of contacting particles, Materials Characterization
Magazine article, 2000

An investigation on nanoparticle contacting using convergent beam electron diffraction (CBED) and high-resolution electron microscopy (HREM) is reported. Cobalt particles (5–200nm) from a solution-treated Cu–2(w/o)Co alloy were extracted and allowed to contact without pressure. The contacting stress field due to adhesion was clearly observed, and the stress field had a dipole character. Free particles were observed to contact along low-index zone axes and with specific orientation relationships. Fourier transformation of the HREM micrographs revealed a highly distorted area along the contacting boundary containing dislocations. Electron-diffraction contrast from the stress fields between contacting particles was simulated, and agreed well with the experiments. © Elsevier Science Inc., 2000. All rights reserved.

Author

Yiming Yao

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

A.R. Thölén

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

MATERIALS CHARACTERIZATION

Vol. 44 441-452

Areas of Advance

Nanoscience and Nanotechnology (2010-2017)

Materials Science

Subject Categories

Other Materials Engineering

Nano Technology

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Created

10/7/2017