Iso-electronic centers in III-V semiconductors studied by Scanning Tunneling Microscopy
Paper in proceedings, 2017

Author

C K Krammel

R Plantega

M Roy

F J Tilley

P A Maksym

L Y Zhang

Shu Min Wang

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

K Volz

L Natterman

M E Flatte

P M Koenraad

8th International Workshop on Bismuth Containing Semiconductors, Marburg, Germany, July 23-26, 2017

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017