Iso-electronic centers in III-V semiconductors studied by Scanning Tunneling Microscopy
Paper in proceeding, 2017
Author
C K Krammel
R Plantega
M Roy
F J Tilley
P A Maksym
L Y Zhang
Shu Min Wang
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
K Volz
L Natterman
M E Flatte
P M Koenraad
8th International Workshop on Bismuth Containing Semiconductors, Marburg, Germany, July 23-26, 2017
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering