High frequency test bench for Rapid Single Flux Quantum circuits
Artikel i vetenskaplig tidskrift, 2006

We have designed and experimentally verified a test bench for high frequency testing of Rapid Single Flux Quantum (RSFQ) circuits. This test bench uses an external tuneable clock signal that is stable in amplitude, phase and frequency. The high frequency external clock reads out the clock pattern stored in a long shift-register. The clock pattern is consequently shifted out at high speed and splitted to feed both the circuit under test and an additional shift register in the test bench for later verification at low speed. This method can be employed for reliable high speed verification of RSFQ circuit operation, with use of only low speed readout electronics. The test bench consists of 158 Josephson junctions and occupied area is 3300 * 660 (mikro meter)^2. It was experimentally verified up to 33 GHz with +- 21.7 % margins on the global bias supply current.

Författare

Henrik Engseth

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fasta tillståndets elektronik

Samuel Intiso

Chalmers, Göteborgs miljövetenskapliga centrum (GMV)

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fasta tillståndets elektronik

Raihan Rafique

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fasta tillståndets elektronik

Elena Tolkacheva

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fasta tillståndets elektronik

Anna Kidiyarova-Shevchenko

Chalmers, Mikroteknologi och nanovetenskap (MC2)

Superconducting Science and technology

Vol. 19 S376-S380

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2017-10-06