Electric and magnetic phenomena studied by in situ transmission electron microscopy
Artikel i vetenskaplig tidskrift, 2008

There is a wide array of technologically significant materials whose response to electric and magnetic fields can make or break their utility for specific applications. Often, these electrical and magnetic properties are determined by nanoscale features that can be most effectively understood through electron microscopy studies. Here, we present an overview of the capabilities for transmission electron microscopy for uncovering information about electric and magnetic properties of materials in the context of operational devices. When devices are operated during microscope observations, a wealth of information is available about dynamics, including metastable and transitional states. Additionally, because the imaging beam is electrically charged, it can directly capture information about the electric and magnetic fields in and around devices of interest. This is perhaps most relevant to the growing areas of nanomaterials and nanodevice research. Several specific examples are presented of materials systems that have been explored with these techniques. We also provide a view of the future directions for research.

ELECTRODEPOSITION

GROWTH

NANOMEASUREMENTS

SCANNING TUNNELING MICROSCOPE

TEM-STM

DEVICES

P-N-JUNCTIONS

HOLOGRAPHY

INDIVIDUAL CARBON NANOTUBES

HOLDER

Författare

J. Cumings

Eva Olsson

Chalmers, Teknisk fysik, Mikroskopi och mikroanalys

A. K. Petford-Long

Y. M. Zhu

MRS Bulletin

0883-7694 (ISSN)

Vol. 33 101-106

Ämneskategorier

Annan teknik