Fourth workshop on dependable and secure nanocomputing
Paper i proceeding, 2010

Nanocomputing technologies hold the promise for higher performance, lower power consumption as well as increased functionality. However, the dependability of these unprecedentedly small scale devices remains uncertain. The main sources of concern are: • Nanometer devices are expected to be highly sensitive to process variations. The guard-bands used today for avoiding the impact of such variations will not represent a feasible solution in the future. Thus, timing errors may occur more frequently. • New failure modes, specific to new materials, are expected to raise serious challenges to the design and test engineers. • Environment induced errors, like single event upsets (SED), are likely to occur more frequently than in the case of conventional semiconductor devices. • New hardware redundancy techniques are needed to enable development of energy efficient systems. • The increased complexity of the systems based on nanotechnology will require improved computer aided design (CAD) tools, as well as better validation techniques. • Security of nanocomputing systems may be threatened by malicious attacks targeting new vulnerable areas in the hardware. © 2010 IEEE.


Jean Arlat

Universite de Toulouse

Cristian Constantinescu

Advanced Micro Devices, Inc.

Ravishankar Krishnan Iyer

University of Illinois at Urbana-Champaign

Johan Karlsson

Chalmers, Data- och informationsteknik, Datorteknik

Michael Nicolaïdis

Universite Grenoble Alpes

Proceedings of the International Conference on Dependable Systems and Networks; 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010; Chicago, IL; 28 June 2010 through 1 July 2010