Impact of photon lifetime on thermal rollover in 850-nm high-speed VCSELs
Paper i proceeding, 2012

We present an empirical thermal model for VCSELs based on extraction of temperature dependence of macroscopic VCSEL parameters from CW measurements. We apply our model to two, oxide-confined, 850-nm VCSELs, fabricated with a 9-mu m inner-aperture diameter and optimized for high-speed operation. We demonstrate that for both these devices, the power dissipation due to linear heat sources dominates the total self-heating. We further show that reducing photon lifetime down to 2 ps drastically reduces absorption heating and improves device static performance by delaying the onset of thermal rollover. The new thermal model can identify the mechanisms limiting the thermal performance and help in formulating the design strategies to ameliorate them.

Heat sources

thermal effects

Thermal Performance

vertical cavity surface emitting lasers

carrier leakage

Vertical cavity surface emitting laser

Thermal model

Surface emitting lasers

Thermal rollover

High-speed operation

Photons

Temperature dependence

photon lifetime

High-speed

Thermography (temperature measurement)

Static performance

Self-heating

Design strategies

Författare

P. P. Baveja

University of Rochester Institute of Optics

Benjamin Kögel

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Petter Westbergh

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Johan Gustavsson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Åsa Haglund

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

D. N. Maywar

Rochester Institute of Technology

G. P. Agrawal

University of Rochester Institute of Optics

Anders Larsson

Chalmers, Mikroteknologi och nanovetenskap (MC2), Fotonik

Proceedings of SPIE - The International Society for Optical Engineering

0277786X (ISSN)

Vol. 8276 82760V

Ämneskategorier

Telekommunikation

DOI

10.1117/12.906784

ISBN

9780819489197

Mer information

Skapat

2017-10-07