Impact of photon lifetime on thermal rollover in 850-nm high-speed VCSELs
Paper i proceeding, 2012
We present an empirical thermal model for VCSELs based on extraction of temperature dependence of macroscopic VCSEL parameters from CW measurements. We apply our model to two, oxide-confined, 850-nm VCSELs, fabricated with a 9-mu m inner-aperture diameter and optimized for high-speed operation. We demonstrate that for both these devices, the power dissipation due to linear heat sources dominates the total self-heating. We further show that reducing photon lifetime down to 2 ps drastically reduces absorption heating and improves device static performance by delaying the onset of thermal rollover. The new thermal model can identify the mechanisms limiting the thermal performance and help in formulating the design strategies to ameliorate them.
Heat sources
thermal effects
Thermal Performance
vertical cavity surface emitting lasers
carrier leakage
Vertical cavity surface emitting laser
Thermal model
Surface emitting lasers
Thermal rollover
High-speed operation
Photons
Temperature dependence
photon lifetime
High-speed
Thermography (temperature measurement)
Static performance
Self-heating
Design strategies
Författare
P. P. Baveja
University of Rochester Institute of Optics
Benjamin Kögel
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Petter Westbergh
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Johan Gustavsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Åsa Haglund
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
D. N. Maywar
Rochester Institute of Technology
G. P. Agrawal
University of Rochester Institute of Optics
Anders Larsson
Chalmers, Mikroteknologi och nanovetenskap, Fotonik
Proceedings of SPIE - The International Society for Optical Engineering
0277786X (ISSN) 1996756X (eISSN)
Vol. 8276 82760V9780819489197 (ISBN)
Ämneskategorier (SSIF 2011)
Telekommunikation
DOI
10.1117/12.906784
ISBN
9780819489197