Graphene Conductance Uniformity Mapping
Artikel i vetenskaplig tidskrift, 2012

We demonstrate a combination of micro four-point probe (M4PP) and non-contact terahertz time-domain spectroscopy (THz-TDS) measurements for centimeter scale quantitative mapping of the sheet conductance of large area chemical vapor deposited graphene films. Dual configuration M4PP measurements, demonstrated on graphene for the first time, provide valuable statistical insight into the influence of microscale defects on the conductance, while THz-TDS has potential as a fast, non-contact metrology method for mapping of the spatially averaged nanoscopic conductance on wafer-scale graphene with scan times of less than a minute for a 4-in. wafer. The combination of M4PP and THz-TDS conductance measurements, supported by micro Raman spectroscopy and optical imaging, reveals that the film is electrically continuous on the nanoscopic scale with microscopic defects likely originating from the transfer process, dominating the microscale conductance of the investigated graphene film.

conductivity

epitaxial graphene

Graphene

electrodes

micro four-point probe

terahertz

imaging electrical characterization

metrology

terahertz

optoelectronics

4-point probe

large-area graphene

layer graphene

infrared-spectroscopy

films

Författare

J. D. Buron

Danmarks Tekniske Universitet (DTU)

D. H. Petersen

Danmarks Tekniske Universitet (DTU)

P. Boggild

Danmarks Tekniske Universitet (DTU)

D. G. Cooke

McGill University

M. Hilke

McGill University

Jie Sun

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

E. Whiteway

McGill University

P. F. Nielsen

Capres AS

O. Hansen

Danmarks Tekniske Universitet (DTU)

Avgust Yurgens

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

P. U. Jepsen

Danmarks Tekniske Universitet (DTU)

Nano Letters

1530-6984 (ISSN) 1530-6992 (eISSN)

Vol. 12 10 5074-5081

Ämneskategorier

Fysik

DOI

10.1021/nl301551a