Mass loading induced dephasing in nanomechanical resonators
Artikel i vetenskaplig tidskrift, 2012

This paper presents a study of dephasing of an underdamped nanomechanical resonator subject to random mass loading of small particles. A frequency noise model is presented which describes dephasing due to the attachment and detachment of particles at random points and particle diffusion along the resonator. This situation is commonly encountered in current mass measurement experiments using nanoelectromechanical (NEM) resonators. The conditions which can lead to inhomogeneous broadening and fine structure in the modes' absorption spectra are discussed. It is also shown that the spectra of the higher-order cumulants of the (complex) vibrational mode amplitude are sensitive to the parameters characterizing the frequency noise process. Hence, measurement of these cumulants can provide information not only about the mass but also about other parameters of the particles (diffusion coefficient and attachment-detachment rates).

resolution

sensor

mechanical resonators

Författare

Juan Atalaya

Chalmers, Teknisk fysik, Kondenserade materiens teori

Journal of Physics Condensed Matter

0953-8984 (ISSN)

Vol. 24 475301

Ämneskategorier

Den kondenserade materiens fysik

DOI

10.1088/0953-8984/24/47/475301