Weak localization scattering lengths in epitaxial, and CVD graphene
Artikel i vetenskaplig tidskrift, 2012

Weak localization in graphene is studied as a function of carrier density in the range from 1 x 10(11) cm(-2) to 1.43 x 10(13) cm(-2) using devices produced by epitaxial growth onto SiC and CVD growth on thin metal film. The magnetic field dependent weak localization is found to be well fitted by theory, which is then used to analyze the dependence of the scattering lengths L-phi, L-i, and L-* on carrier density. We find no significant carrier dependence for L-phi, a weak decrease for L-i with increasing carrier density just beyond a large standard error, and a n(-1/4) dependence for L-*. We demonstrate that currents as low as 0.01 nA are required in smaller devices to avoid hot-electron artifacts in measurements of the quantum corrections to conductivity.

electronic-properties

bilayer graphene

Författare

A. M. R. Baker

J. A. Alexander-Webber

T. Altebaeumer

Tjbm Janssen

A.Y. Tzalenchuk

Samuel Lara Avila

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

Sergey Kubatkin

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

R. Yakimova

C. T. Lin

L. J. Li

R. J. Nicholas

Physical Review B - Condensed Matter and Materials Physics

1098-0121 (ISSN)

Vol. 86

Ämneskategorier

Fysik

DOI

10.1103/PhysRevB.86.235441