Optical response of a titanium-based cold-electron bolometer
Artikel i vetenskaplig tidskrift, 2013

We present experimental results on the testing of cold-electron bolometer (CEB) detectors comprised of a thin Ti film absorber and two SIN junctions integrated with a planar antenna. The CEB performance was tested in a He-3 sorption cryostat HELIOX-AC-V at bath temperatures of 280-305 mK. The optical response was measured using the hot/cold load method by flipping a Cu reflector opposite a blackbody surface inside a 3 K shield and using a thermal source with variable temperature. In the first experiment, the detector chip was mounted in an optical sample-holder whose aperture was switched towards or away from a blackbody source changing the incident radiation temperature from 3 K to 270 mK. As a result, we measured the optical response to a 3 K/270 mK radiation temperature change. The measured voltage response value for the detector integrated in a double-dipole antenna was Delta V-out = 120 mu V. This corresponds to a noise equivalent power of NEP = V-n/(dV/dP) = 3.5 x 10(-17) W Hz(-1/2), where dV/dP is the voltage to power response obtained from the incoming power estimation based on the Planck formula.


Ernst Otto

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Mikhail Tarasov

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

P. K. Grimes

University of Oxford

Smithsonian Astrophysical Observatory

Artem Chekushkin

Chalmers, Mikroteknologi och nanovetenskap

Leonid Kuzmin

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

G. Yassin

University of Oxford

Superconductor Science and Technology

0953-2048 (ISSN) 1361-6668 (eISSN)

Vol. 26 8 085020





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