On logic test generation : algorithms and methods for combinational test generation
Licentiatavhandling, 2000
bridging faults
switchh level
binary decision diagrams
testability
feedback
ATPG
Författare
Hans Kristian Wiklund
Institutionen för datorteknik
Ämneskategorier
Datorteknik
ISBN
993-257304-3
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 346