On logic test generation : algorithms and methods for combinational test generation
Licentiatavhandling, 2000

bridging faults

switchh level

binary decision diagrams

testability

feedback

ATPG

Författare

Hans Kristian Wiklund

Institutionen för datorteknik

Ämneskategorier

Datorteknik

ISBN

993-257304-3

Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 346