On logic test generation : algorithms and methods for combinational test generation
Licentiatavhandling, 2000

bridging faults

switchh level

binary decision diagrams

testability

feedback

ATPG

Författare

Hans Kristian Wiklund

Institutionen för datorteknik

Ämneskategorier (SSIF 2011)

Datorteknik

ISBN

993-257304-3

Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 346

Mer information

Skapat

2017-10-07