On logic test generation : algorithms and methods for combinational test generation
Licentiatavhandling, 2000
bridging faults
switchh level
binary decision diagrams
testability
feedback
ATPG
Författare
Hans Kristian Wiklund
Institutionen för datorteknik
Ämneskategorier (SSIF 2011)
Datorteknik
ISBN
993-257304-3
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 346