Depth Profiling with the Chalmers Pulsed Positron Beam
Artikel i vetenskaplig tidskrift, 2014

Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron behaviour in solids and calibrating the Chalmers Pulsed Positron Beam. Experiments are executed for positron energies up to 13 keV corresponding to the maximum penetration depth in Au of roughly 400 nm and measurement results are compared to PENELOPE simulations. Reference towards Makhov modelling is made. The future goal of the study is to investigate the depth dependence of ion-induced radiation damage where positrons will be used to characterise sizes and intensities of vacancy-type lattice defects.

Makhov modelling

resolution function

positron penetration

calibration

positrons

simulation

positron lifetime

Chalmers pulsed positron beam

solids.

depth profile

radiation damage

Författare

Petty Bernitt Cartemo

Chalmers, Teknisk fysik, Nukleär teknik

Anders Nordlund

Chalmers, Teknisk fysik, Nukleär teknik

International Journal of Nuclear Energy Science and Technology

1741-6361 (ISSN) 1741-637X (eISSN)

Vol. 8 105 - 116

Styrkeområden

Energi

Materialvetenskap

Ämneskategorier

Annan materialteknik

Den kondenserade materiens fysik

DOI

10.1504/IJNEST.2014.060092