Depth Profiling with the Chalmers Pulsed Positron Beam
Artikel i vetenskaplig tidskrift, 2014
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron behaviour in solids and calibrating the Chalmers Pulsed Positron Beam. Experiments are executed for positron energies up to 13 keV corresponding to the maximum penetration depth in Au of roughly 400 nm and measurement results are compared to PENELOPE simulations. Reference towards Makhov modelling is made. The future goal of the study is to investigate the depth dependence of ion-induced radiation damage where positrons will be used to characterise sizes and intensities of vacancy-type lattice defects.
Makhov modelling
resolution function
positron penetration
calibration
positrons
simulation
positron lifetime
Chalmers pulsed positron beam
solids.
depth profile
radiation damage
Författare
Petty Bernitt Cartemo
Chalmers, Teknisk fysik, Nukleär teknik
Anders Nordlund
Chalmers, Teknisk fysik, Nukleär teknik
International Journal of Nuclear Energy Science and Technology
1741-6361 (ISSN) 1741-637X (eISSN)
Vol. 8 2 105 - 116Styrkeområden
Energi
Materialvetenskap
Ämneskategorier
Annan materialteknik
Den kondenserade materiens fysik
DOI
10.1504/IJNEST.2014.060092