Effective Electron Microrefrigeration by SIN Tunnel Junctions with Advanced Geometry of Electrodes and Normal Metal Traps
Artikel i vetenskaplig tidskrift, 2004

We demonstrate effective electron cooling of the normal metal strip by superconductor-insulator-normal metal (SIN) tunnel junctions. The improvement was achieved by two methods: first by using an advanced geometry of the superconducting electrodes for more effective removal of the quasiparticles; and second, by adding a normal metal trap just near the cooling junctions. With simple cross geometry and without normal metal traps, the decrease in electron temperature is 56 mK. With the advanced geometry of the superconducting electrodes, the decrease in electron temperature is 129 mK. With the addition of the normal metal traps, the decrease in electron temperature is 197 mK.

normal metal traps

electron refrigeration

SIN tunnel junctions

Författare

Ian Jasper Agulo

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Leonid Kuzmin

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Michael Fominsky

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Mikhail Tarasov

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Nanotechnology

Vol. 15 S224-S228

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2017-10-07