X-ray study of SrTiO3 thin films in multilayer structures
Artikel i vetenskaplig tidskrift, 2000

A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples ω- and φ-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers.

Författare

Peter Petrov

Zdravko Ivanov

Institutionen för fysik

Spartak Gevorgian

Institutionen för mikroelektronik och nanovetenskap

Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

0921-5093 (ISSN)

Vol. 288 231-234

Ämneskategorier

Den kondenserade materiens fysik

DOI

10.1016/S0921-5093(00)00846-7