X-ray study of SrTiO3 thin films in multilayer structures
Artikel i vetenskaplig tidskrift, 2000

A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples ω- and φ-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers.


Peter Petrov

Zdravko Ivanov

Institutionen för fysik

Spartak Gevorgian

Institutionen för mikroelektronik och nanovetenskap

Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

0921-5093 (ISSN)

Vol. 288 231-234


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