X-ray study of SrTiO3 thin films in multilayer structures
Artikel i vetenskaplig tidskrift, 2000
A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples ω- and φ-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers.
Författare
Peter Petrov
Zdravko Ivanov
Institutionen för fysik
Spartak Gevorgian
Institutionen för mikroelektronik och nanovetenskap
Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing
0921-5093 (ISSN)
Vol. 288 2 231-234Ämneskategorier
Den kondenserade materiens fysik
DOI
10.1016/S0921-5093(00)00846-7