Electron transport and microwave dynamics of hybrid Nb/Au/CaSrCuO/YBaCuO planar Josephson junctions
Paper i proceeding, 2009

We report on measurements of dc electron transport and microwave dynamics of thin film hybrid Josephson junctions with an oxide antiferromagnetic interlayer. The base superconducting electrode YBaCuO and the antiferromagnetic (AF) interlayer CaSrCuO (with thickness d 20 - 70 nm) were grown by laser ablation on NdGaO3 substrates. I-V curves were well fitted to RSJ model and had no excess current, ICRN products were of order 0.2 mV at T=4.2 K. We did not observe any noticeable reduction of I CRN with increasing d. Such "tunnellike" behaviour also resulted in appearance of singularities on I-V curve when magnetic field was applied. Oscillating with microwave power integer and half-integer Shapiro steps were registered along with sub-harmonic detector response. Moreover, for some of junctions a "devil" staircase structure was observed on I-V curves and giant noise-like signals were measured in 1-2 GHz band at the certain levels of microwave power. Observed features, noise performance and the impact of the second harmonic in current-phase relation on junction dynamics are discussed taking into account data for structures without AF interlayer.

Författare

K. Y. Constantinian

National Research University of Electronic Technology (MIET)

Gennady Ovsyannikov

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Yu V. Kislinskiǐ

National Research University of Electronic Technology (MIET)

A. V. Shadrin

National Research University of Electronic Technology (MIET)

I. V. Borisenko

National Research University of Electronic Technology (MIET)

P. V. Komissinskiy

National Research University of Electronic Technology (MIET)

Technische Universität Darmstadt

A. V. Zaǐtsev

National Research University of Electronic Technology (MIET)

J. Mygind

Danmarks Tekniske Universitet (DTU)

Dag Winkler

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

Journal of Physics: Conference Series

17426588 (ISSN) 17426596 (eISSN)

Vol. 234 4 Art. no. 042004- 042004

Ämneskategorier

Materialteknik

Nanoteknik

DOI

10.1088/1742-6596/234/4/042004

Mer information

Senast uppdaterat

2022-04-05