The dramatic effect of the annealing temperature and dielectric functionalization on the electron mobility of indene-C60 bis-adduct thin films
Artikel i vetenskaplig tidskrift, 2015
Författare
E. Orgiu
M.A. Squillaci
W. Rekab
Karl Börjesson
F. Liscio
L. Zhang
P. Samorì
Chemical Communications
1359-7345 (ISSN) 1364-548X (eISSN)
Vol. 51 25 5414-5417Ämneskategorier
Materialkemi
DOI
10.1039/c5cc00151j