3D laser scanning confocal microscopy of siloxane-based comb and double-comb polymers in PVDF-HFP thin films
Artikel i vetenskaplig tidskrift, 2016

Currently, atomic force microscopy is the preferred technique to determine roughness on membrane surfaces. In this paper, a new method to measure surface roughness is presented using a 3D laser scanning confocal microscope for high-resolution topographic analysis and is compared to conventional SEM. For this study, the surfaces of eight samples based on a poly(vinylidene fluoride-co-hexafluoropropylene) (PVDF-HFP) host polymer with different liquid interpenetrating components were analyzed. Polymethylhydrosiloxane, triethylene glycolallylmethyether, (3,3,3-trifluoropropyl) methylcyclotrisiloxane (D-3-C2H4CF3), polysiloxane-comb-propyloxymethoxytriglycol (PSx), poly-siloxane-comb-propyl-3,3,3-trifluoro (PSx-C2H4CF3), poly [bis(2-(2-methoxyethoxy) ethoxy) phosphazene, or poly [bis(trifluoro) ethoxy] phosphazene was chosen as interpenetrating compound to investigate the impact of comb and double-comb-structured polymer backbones, as well as their dipolar or fluorous residues on the PVDF-HFP-miscibility. Different phases of the constituting ingredients were identified via their thermal properties determined by DSC. Additionally, the COSMO-RS method supported the experimental results, and with regard to computed sigma-profiles, new modified structures for polysiloxane and polyphosphazene synthesis were suggested.

comb and double-comb polymers

Polymer electrolyte

Thin film

3D laser scanning confocal microscopy


E. Cznotka

Universität Münster

Steffen Jeschke

Chalmers, Fysik, Kondenserade materiens fysik

S. Schmohl

Universität Münster

Patrik Johansson

Chalmers, Fysik, Kondenserade materiens fysik

H. D. Wiemhofer

Universität Münster

Journal of Coatings Technology Research

1547-0091 (ISSN) 1935-3804 (eISSN)

Vol. 13 4 577-587




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