Two-Ray Reflection Resolution Algorithm for Planar Material Electromagnetic Property Measurement at the Millimeter-Wave Bands
Artikel i vetenskaplig tidskrift, 2020

Electromagnetic (EM) reflection properties of building materials and structures have been investigated through practical measurements. However, the finite thickness of measured materials makes it challenging to resolve the rays reflected from the front and the back surfaces. In this paper, we therefore present a three-step minimum least squares-based algorithm to resolve two closely adjacent rays reflected from the front and the back surfaces of a board-shaped material. Our analytical and numerical results show that the proposed algorithm achieves the Cramér-Rao lower bound. The proposed algorithm is validated using measurement data for various materials and incident angles in the 40–50 GHz frequency band. The validation results show that the proposed algorithm is capable of resolving two closely adjacent rays with a root-mean-square deviation that is smaller than 0.08. Main applications of the proposed algorithm can be found in the frequency domain measurements of the EM wave reflections by typical building structures, e.g., window glass, doors, ceiling, and floors.

Författare

Jiliang Zhang

University of Sheffield

Xi Liao

Chongqing University of Posts and Telecommunications

Andres Alayon Glazunov

Chalmers, Elektroteknik, Kommunikations- och antennsystem, Antennsystem

Universiteit Twente

Yu Shao

Chongqing University of Posts and Telecommunications

Yang Wang

Chongqing University of Posts and Telecommunications

Xiaoli Chu

University of Sheffield

Jie Zhang

Ranplan Wireless Network Design Ltd

University of Sheffield

Radio Science

0048-6604 (ISSN)

Vol. 55 3 e2019RS006944

Ämneskategorier

Teknisk mekanik

Materialkemi

Annan fysik

DOI

10.1029/2019RS006944

Mer information

Senast uppdaterat

2020-09-29