Noise Performance of Single-Mode VCSELs: Dependence on Current Confinement and Optical Loss
Artikel i vetenskaplig tidskrift, 2020

We investigate the intensity and phase noise properties of GaAs-based 1060 nm oxide-confined single-mode vertical-cavity surface-emitting lasers (VCSELs) and their dependence on slope efficiency and current spreading, parameters that control the achievable output power. We find strong dependence of the linewidth on slope efficiency because it affects the optical resonator loss and therefore the spontaneous emission rate and the photon density. Likewise, we find strong dependence of the relative intensity noise on the slope efficiency since the optical resonator loss controls the photon lifetime, and therefore the damping of the relaxation oscillations. There is no noticeable dependence on transverse current confinement and current spreading. We measure linewidths as small as 6 MHz which we attribute to a small linewidth enhancement factor. This assumption is supported by calculations of the linewidth enhancement factor from optical resonator and optical gain simulations. The dependencies of noise on design parameters are general and therefore valid for single-mode VCSELs at other wavelengths and in other material systems.

single-mode

RIN

noise

Linewidth

vertical-cavity surface-emitting lasers

Författare

Ewa Simpanen

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

Johan Gustavsson

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

P. Debernardi

Consiglo Nazionale Delle Richerche

W. V. Sorin

Hewlett-Packard Company

S. Mathai

Hewlett-Packard Company

M. R. Tan

Hewlett-Packard Company

Anders Larsson

Chalmers, Mikroteknologi och nanovetenskap, Fotonik

IEEE Journal of Quantum Electronics

0018-9197 (ISSN) 15581713 (eISSN)

Vol. 56 5 9127424

Integrerade optiska sändare för våglängdsmultiplexering i datacenternätverk

Vetenskapsrådet (VR) (2016-06077), 2017-01-01 -- 2022-12-31.

Ämneskategorier

Atom- och molekylfysik och optik

Annan fysik

Annan elektroteknik och elektronik

DOI

10.1109/JQE.2020.3005380

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Senast uppdaterat

2024-02-23