Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging
Artikel i vetenskaplig tidskrift, 2014
We present two approaches for studying the uniformity of a tunnel barrier. The first approach is based on measuring single-electron and two-electron tunneling in a hybrid single-electron transistor. Our measurements indicate that the effective area of a conduction channel is about one order of magnitude larger than predicted by theoretical calculations. With the second method, transmission electron microscopy, we demonstrate that variations in the barrier thickness are a plausible explanation for the larger effective area and an enhancement of higher order tunneling processes.
Författare
Thomas Aref
Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik
Aalto-Yliopisto
A. Averin
Aalto-Yliopisto
S. van Dijken
Aalto-Yliopisto
A. Ferring
Universität Heidelberg
M. Koberidze
Aalto-Yliopisto
V. F. Maisi
VTT MIKES Metrologia
Aalto-Yliopisto
Eidgenössische Technische Hochschule Zürich (ETH)
H.Q. Nguyend
Aalto-Yliopisto
Vietnam National University
R Nieminen
Aalto-Yliopisto
Jukka Pekola
Aalto-Yliopisto
Lide Yao
Aalto-Yliopisto
Journal of Applied Physics
0021-8979 (ISSN) 1089-7550 (eISSN)
Vol. 116 7 073702Ämneskategorier
Atom- och molekylfysik och optik
Materialkemi
Den kondenserade materiens fysik
DOI
10.1063/1.4893473