Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography
Reviewartikel, 2024
As hydrogen is touted as a key player in the decarbonization of modern society, it is critical to enable quantitative hydrogen (H) analysis at high spatial resolution and, if possible, at the atomic scale. H has a known deleterious impact on the mechanical properties (strength, ductility, toughness) of most materials that can hinder their use as part of the infrastructure of a hydrogen-based economy. Enabling H mapping including local hydrogen concentration analyses at specific microstructural features is essential for understanding the multiple ways that H affect the properties of materials including embrittlement mechanisms and their synergies. In addition, spatial mapping and quantification of hydrogen isotopes is essential to accurately predict tritium inventory of future fusion power plants thus ensuring their safe and efficient operation. Atom probe tomography (APT) has the intrinsic capability to detect H and deuterium (D), and in principle the capacity for performing quantitative mapping of H within a material's microstructure. Yet, the accuracy and precision of H analysis by APT remain affected by complex field evaporation behavior and the influence of residual hydrogen from the ultrahigh vacuum chamber that can obscure the signal of H from within the material. The present article reports a summary of discussions at a focused workshop held at the Max-Planck Institute for Sustainable Materials in April 2024. The workshop was organized to pave the way to establishing best practices in reporting APT data for the analysis of H. We first summarize the key aspects of the intricacies of H analysis by APT and then propose a path for better reporting of the relevant data to support interpretation of APT-based H analysis in materials.
atom probe tomography
deuterium
hydrogen
Författare
Baptiste Gault
Imperial College London
Max-Planck-Gesellschaft
Aparna Saksena
Max-Planck-Gesellschaft
Xavier Sauvage
INSA
Paul Bagot
University of Oxford
Leonardo S. Aota
Max-Planck-Gesellschaft
Jonas Arlt
Georg-August-Universität Göttingen
Lisa T. Belkacemi
Leibniz Institute for Materials Engineering IWT
Universität Bremen
Torben Boll
Karlsruher Institut für Technologie (KIT)
Yi-sheng Chen
Nayang Technological University
University of Sydney
Luke Daly
University of Oxford
University of Glasgow
University of Sydney
Milos B. Djukic
Univerzitet u Beogradu
James O. Douglas
Imperial College London
Maria J. Duarte
Max-Planck-Gesellschaft
Peter J. Felfer
Friedrich-Alexander-Universität Erlangen Nurnberg (FAU)
Richard G. Forbes
University of Surrey
Jing Fu
Monash University
Hazel M. Gardner
UK Atomic Energy Authority
Ryota Gemma
Tokai University
Stephan S A Gerstl
Eidgenössische Technische Hochschule Zürich (ETH)
Yilun Gong
University of Oxford
Max-Planck-Gesellschaft
Guillaume Hachet
Max-Planck-Gesellschaft
Severin Jakob
Chalmers, Fysik, Mikrostrukturfysik
Benjamin M. Jenkins
INSA
Megan E. Jones
National Nuclear Laboratory
Heena Khanchandani
Norges teknisk-naturvitenskapelige universitet
Paraskevas Kontis
Norges teknisk-naturvitenskapelige universitet
Mathias Krämer
Max-Planck-Gesellschaft
Markus Kühbach
Humboldt-Universität zu Berlin
Ross K. W. Marceau
Deakin University
David Mayweg
Chalmers, Fysik, Mikrostrukturfysik
Katie L. Moore
University of Manchester
Varatharaja Nallathambi
Max-Planck-Gesellschaft
Universität Duisburg-Essen
Benedict C. Ott
Friedrich-Alexander-Universität Erlangen Nurnberg (FAU)
Jonathan D. Poplawsky
Oak Ridge National Laboratory
Ty Prosa
Cameca Instruments Inc.
Astrid Pundt
Karlsruher Institut für Technologie (KIT)
Mainak Saha
National Institute for Materials Science (NIMS)
Tim M. Schwarz
Max-Planck-Gesellschaft
Yuanyuan Shang
Helmholtz-Gemeinschaft Deutscher Forschungszentren
Xiao Shen
Universität Kassel
Maria Vrellou
Karlsruher Institut für Technologie (KIT)
Yuan Yu
RWTH Aachen University
Yujun Zhao
Ruhr-Universität Bochum
Huan Zhao
Xi'an Jiaotong University
Bowen Zou
Universität Kassel
Microscopy and Microanalysis
1431-9276 (ISSN) 1435-8115 (eISSN)
Vol. 30 6 1205-1220Ämneskategorier (SSIF 2011)
Materialteknik
Atom- och molekylfysik och optik
DOI
10.1093/mam/ozae081
PubMed
39226242