Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7-delta microbridges and bicrystal junctions
Artikel i vetenskaplig tidskrift, 2004

We report on depairing critical currents in submicron YBa 2 Cu 3 O 7-δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I-V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S-S ′ -S nature of the small-angle grain boundary junction. © 2004 American Institute of Physics.



Zdravko G. Ivanov

Chalmers, Mikroteknologi och nanovetenskap (MC2)

Nina Ya. Fogel

Göteborgs universitet

O. I. Yuzephovich

B Verkin Institute for Low Temperature Physics and Engineering Nasu

Russian Academy of Sciences

EA Stepantsov

Russian Academy of Sciences

A.Y. Tzalenchuk

Russian Academy of Sciences

Low Temperature Physics

1063-777X (ISSN) 1090-6517 (eISSN)

Vol. 30 203-207


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