Depairing critical currents and self-magnetic field effects in submicron YBa2Cu3O7-delta microbridges and bicrystal junctions
Artikel i vetenskaplig tidskrift, 2004

We report on depairing critical currents in submicron YBa 2 Cu 3 O 7-δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I-V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S-S ′ -S nature of the small-angle grain boundary junction. © 2004 American Institute of Physics.



Zdravko G. Ivanov

Chalmers, Mikroteknologi och nanovetenskap (MC2)

Nina Ya. Fogel

Göteborgs universitet

O. I. Yuzephovich

Institute for Low Temperature Physics and Engineering

Russian Academy of Sciences

EA Stepantsov

Russian Academy of Sciences

A.Y. Tzalenchuk

Russian Academy of Sciences

Low Temperature Physics

1063-777X (ISSN) 1090-6517 (eISSN)

Vol. 30 3 203-207


Annan teknik



Mer information

Senast uppdaterat