Low-frequency current noise of the single-electron shuttle
Artikel i vetenskaplig tidskrift, 2004
Coupling between electronic and mechanical degrees of freedom in a single-electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low-frequency current noise can be enhanced due to slow fluctuations of the shuttle oscillation energy. Moreover, at the onset of mechanical instability a pronounced peak in the low-frequency noise is expected.