Low-frequency current noise of the single-electron shuttle
Artikel i vetenskaplig tidskrift, 2004

Coupling between electronic and mechanical degrees of freedom in a single-electron shuttle system can cause a mechanical instability leading to shuttle transport of electrons between external leads. We predict that the resulting low-frequency current noise can be enhanced due to slow fluctuations of the shuttle oscillation energy. Moreover, at the onset of mechanical instability a pronounced peak in the low-frequency noise is expected.

coulomb-blockade nanostructures

instability

transistor

transport

Författare

Andreas Isacsson

Chalmers, Teknisk fysik

Tomas Nord

Chalmers, Teknisk fysik

Europhysics Letters

0295-5075 (ISSN) 1286-4854 (eISSN)

Vol. 66 5 708-714

Ämneskategorier

Fysik

DOI

10.1209/epl/i2004-10024-x