Uncertainty estimation and optimal extraction of intrinsic FET small-signal model parameters
Paper in proceeding, 2002
Author
Christian Fager
Department of Microelectronics
Peter Linner
Department of Microelectronics and Nanoscience
J.C. Pedro
IEEE MTT-S International Microwave Symposium
Vol. 2 729-32
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering