Uncertainty estimation and optimal extraction of intrinsic FET small-signal model parameters
Paper in proceedings, 2002

Author

Christian Fager

Department of Microelectronics

Peter Linner

Department of Microelectronics and Nanoscience

J.C. Pedro

IEEE MTT-S International Microwave Symposium

Vol. 2 729-32

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017