Evaluation of new and improved thermal interface materials and surface roughness effect on thermal interface resistance
Paper in proceeding, 2009
Author
Carl Zandén
Chalmers, Applied Physics, Electronics Material and Systems
Björn Carlberg
Chalmers, Applied Physics, Electronics Material and Systems
Johan Liu
Chalmers, Applied Physics, Electronics Material and Systems
Proceedings of the The International 3rd Swedish Production Symposium (SPS)
88-96
978-91-633-6006-0 (ISBN)
Subject Categories
Materials Engineering
ISBN
978-91-633-6006-0