Evaluation of new and improved thermal interface materials and surface roughness effect on thermal interface resistance
Paper in proceedings, 2009

Author

Carl Zandén

Chalmers, Applied Physics, Electronics Material and Systems Laboratory

Björn Carlberg

Chalmers, Applied Physics, Electronics Material and Systems Laboratory

Johan Liu

Chalmers, Applied Physics, Electronics Material and Systems Laboratory

Proceedings of the The International 3rd Swedish Production Symposium (SPS)

88-96

Subject Categories

Materials Engineering

ISBN

978-91-633-6006-0

More information

Created

10/7/2017