Evaluation of new and improved thermal interface materials and surface roughness effect on thermal interface resistance
Paper in proceedings, 2009
Author
Carl Zandén
Chalmers, Applied Physics, Electronics Material and Systems Laboratory
Björn Carlberg
Chalmers, Applied Physics, Electronics Material and Systems Laboratory
Johan Liu
Chalmers, Applied Physics, Electronics Material and Systems Laboratory
Proceedings of the The International 3rd Swedish Production Symposium (SPS)
88-96
Subject Categories
Materials Engineering
ISBN
978-91-633-6006-0