Macroscopic defects in GaN/AlN multiple quantum well structures grown by MBE on GaN templates
Journal article, 2009
Template
MBE
Surface cracks
Sapphire substrate
Intersubband
GaN
Author
Thorvald Andersson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Xinju Liu
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
T. Aggerstam
Royal Institute of Technology (KTH)
P. Holmstrom
Royal Institute of Technology (KTH)
S. Lourdudoss
Royal Institute of Technology (KTH)
L. Thylen
Royal Institute of Technology (KTH)
Y. L. Chen
National Sun Yat-Sen University
C. H. Hsieh
National Sun Yat-Sen University
I. Lo
National Sun Yat-Sen University
Microelectronics
0026-2692 (ISSN)
Vol. 40 2 360-362Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1016/j.mejo.2008.07.065