Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Journal article, 2009
Ultrafast dynamics
Synchrotron radiation
edge
raman-scattering
Spectroscopy
Semiconductors
solids
dynamics
spectra
Soft X-ray scattering (RIXS)
Author
C. J. Glover
Australian National University
T. Schmitt
Paul Scherrer Institut
M. Mattesini
Complutense University
Martin Adell
Chalmers, Applied Physics, Solid State Physics
Lars Ilver
Chalmers, Applied Physics, Solid State Physics
Janusz Kanski
Chalmers, Applied Physics, Solid State Physics
L. Kjeldgaard
Lund University
M. Agaker
Uppsala University
N. Martensson
Uppsala University
Lund University
R. Ahuja
Uppsala University
J. Nordgren
Uppsala University
J. E. Rubensson
Uppsala University
Journal of Electron Spectroscopy and Related Phenomena
0368-2048 (ISSN)
Vol. 173 2-3 103-107Subject Categories
Other Engineering and Technologies
DOI
10.1016/j.elspec.2009.05.017