Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Journal article, 2009

Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.

Ultrafast dynamics

Synchrotron radiation

edge

raman-scattering

Spectroscopy

Semiconductors

solids

dynamics

spectra

Soft X-ray scattering (RIXS)

Author

C. J. Glover

Australian National University

T. Schmitt

Paul Scherrer Institut

M. Mattesini

Complutense University

Martin Adell

Chalmers, Applied Physics, Solid State Physics

Lars Ilver

Chalmers, Applied Physics, Solid State Physics

Janusz Kanski

Chalmers, Applied Physics, Solid State Physics

L. Kjeldgaard

Lund University

M. Agaker

Uppsala University

N. Martensson

Uppsala University

Lund University

R. Ahuja

Uppsala University

J. Nordgren

Uppsala University

J. E. Rubensson

Uppsala University

Journal of Electron Spectroscopy and Related Phenomena

0368-2048 (ISSN)

Vol. 173 2-3 103-107

Subject Categories

Other Engineering and Technologies

DOI

10.1016/j.elspec.2009.05.017

More information

Latest update

4/11/2018