Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Artikel i vetenskaplig tidskrift, 2009

Resonant inelastic soft X-ray scattering at the 3p resonances in crystalline Ge is presented. Both stationary and dispersive features are observed in a wide energy range above as well as below the ionization limits. These observations are in agreement with theoretical predictions based on a two-step model where the initially excited electron has no influence on the emission step. Excess population of states in the conduction band is found, and discussed in terms of attosecond electron dynamics. (c) 2009 Elsevier B.V. All rights reserved.

Ultrafast dynamics

Synchrotron radiation

edge

raman-scattering

Spectroscopy

Semiconductors

solids

dynamics

spectra

Soft X-ray scattering (RIXS)

Författare

C. J. Glover

Australian National University

T. Schmitt

Paul Scherrer Institut

M. Mattesini

Universidad Complutense de Madrid

Martin Adell

Chalmers, Teknisk fysik, Fasta tillståndets fysik

Lars Ilver

Chalmers, Teknisk fysik, Fasta tillståndets fysik

Janusz Kanski

Chalmers, Teknisk fysik, Fasta tillståndets fysik

L. Kjeldgaard

Lunds universitet

M. Agaker

Uppsala universitet

N. Martensson

Uppsala universitet

Lunds universitet

R. Ahuja

Uppsala universitet

J. Nordgren

Uppsala universitet

J. E. Rubensson

Uppsala universitet

Journal of Electron Spectroscopy and Related Phenomena

0368-2048 (ISSN)

Vol. 173 2-3 103-107

Ämneskategorier

Annan teknik

DOI

10.1016/j.elspec.2009.05.017