Recent survey and application of the simSUNDT software
Paper in proceeding, 2010

The simSUNDT software is based on a previous developed program (SUNDT). The latest version has been customized in order to generate realistic synthetic data (including a grain noise model), compatible with a number of off-line analysis software. The software consists of a Windows®-based preprocessor and postprocessor together with a mathematical kernel (UTDefect), dealing with the actual mathematical modeling. The model employs various integral transforms and integral equation and enables simulations of the entire ultrasonic testing situation. The model is completely three-dimensional though the simulated component is two-dimensional, bounded by the scanning surface and a planar back surface as an option. It is of great importance that inspection methods that are applied are proper validated and that their capability of detection of cracks and defects are quantified. In order to achieve this, statistical methods such as Probability of Detection (POD) often are applied, with the ambition to estimate the detectability as a function of defect size. Despite the fact that the proposed procedure with the utilization of test pieces is very expensive, it also tends to introduce a number of possible misalignments between the actual NDT situation that is to be performed and the proposed experimental simulation. The presentation will describe the developed model that will enable simulation of a phased array NDT inspection and the ambition to use this simulation software to generate POD information. The paper also includes the most recent developments of the model including some initial experimental validation of the phased array probe model. © 2010 American Institute of Physics.

Backscattered noise

Phased array model

Ultrasonic

Simulation

Author

Gert Persson

Chalmers, Materials and Manufacturing Technology, Advanced Non-destructive Testing

Håkan Wirdelius

Chalmers, Materials and Manufacturing Technology, Advanced Non-destructive Testing

AIP Conference Proceedings

0094-243X (ISSN) 1551-7616 (eISSN)

Vol. 1211 2125-2132
978-073540748-0 (ISBN)

Subject Categories

Materials Engineering

DOI

10.1063/1.3362392

ISBN

978-073540748-0

More information

Created

10/7/2017