Si-wedge for easy TEM sample preparation for in situ probing
Paper in proceedings, 2005

Si-wedge

sample preparation

TEM

Author

Alexandra Nafari

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Peter Enoksson

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Håkan Olin

Eurosensors

Vol. XIX WPa32-

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017