Si-wedge for easy TEM sample preparation for in situ probing

Alexandra Nafari; Peter Enoksson; Håkan Olin

Si-wedge for easy TEM sample preparation for in situ probing
Paper in proceeding, 2005

Si-wedge

sample preparation

TEM

Author

Alexandra Nafari

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Other publications Research

Peter Enoksson

Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics

Other publications Research

Håkan Olin

Eurosensors

Vol. XIX WPa32-

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/8/2017

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Si-wedge for easy TEM sample preparation for in situ probing Paper in proceeding, 2005