Alexandra Nafari

Showing 27 publications

2014

Monitoring the osmotic response of single yeast cells through force measurement in the environmental scanning electron microscope

Anna Jansson, Alexandra Nafari, Kristina Hedfalk et al
Measurement Science and Technology. Vol. 25 (2), p. Art. no. 025901-
Journal article
2013

Novel Method for Controlled Wetting of Materials in the Environmental Scanning Electron Microscope

Anna Jansson, Alexandra Nafari, Anke Sanz-Velasco et al
Microscopy and Microanalysis. Vol. 19 (1), p. 30-37
Journal article
2012

Ageing of polymeric surfaces exhibiting flow marks - Effects on surface characteristics

Giovanna Iannuzzi, Alexandra Nafari, Antal Boldizar et al
Journal of Applied Polymer Science. Vol. 126 (3), p. 1136-1145
Journal article
2011

Combining Scanning Probe Microscopy and Transmission Electron Microscopy

Alexandra Nafari, Johan Angenete, Krister Svensson et al
Scanning Probe Microscopy in Nanoscience and Nanotechnology, p. 59-134
Book chapter
2011

Characteristics of flow marks in injection-moulded surfaces and their ageing behaviour

Giovanna Iannuzzi, Alexandra Nafari, Mikael Rigdahl
Proc. Advances in Polymer Science and Technology 2, Linz, Austria, p. 30-
Paper in proceedings
2011

Characteristics of flow marks in injection-moulded surfaces and their ageing behaviour

Giovanna Iannuzzi, Alexandra Nafari, Mikael Rigdahl
Proc. Nordic Polymer Days 2011, Stockholm, p. 95-
Conference contribution
2010

Galling related surface properties of powder metallurgical tool steels alloyed with and without nitrogen

Sepehr Hatami, Alexandra Nafari, Lars Nyborg et al
Wear. Vol. 269 (2-4), p. 229-240
Journal article
2010

Microsensors for in situ electron microscopy applications

Alexandra Nafari
Doctoral thesis
2010

Conductive in situ TEM nanoindentation with a new MEMS sensor

Alexandra Nafari, J. Angenete, Krister Svensson et al
MicroStructureWorkshop (MSW), Stockholm, Sweden
Paper in proceedings
2010

MEMS sensor for in situ TEM-nanoindentation with simultaneous force and current measurements

Alexandra Nafari, J. Angenete, Krister Svensson et al
Journal of Micromechanics and Microengineering. Vol. 20 (6)
Journal article
2009

Boron impurity at the Si/SiO2 interface in SOI wafers and consequences for piezoresistive MEMS devices

Alexandra Nafari, David Karlén, Cristina Rusu et al
Journal of Micromechanics and Microengineering. Vol. 19 (1), p. 6-
Journal article
2009

MEMS sensor for in situ TEM-nanoindentation with simultaneous force and current measurements

Alexandra Nafari, Krister Svensson, Anke Sanz-Velasco et al
MicroMechanics Europe 2009, p. 4-
Paper in proceedings
2009

Expanding in situ TEM instrumentation with MEMS technology

Alexandra Nafari, Johan Angenete
Commersialization of micro and nano systems (COMS) 2009, p. 2-
Paper in proceedings
2008

Boron at Si/SiO2 interface in SOI wafers and consequences for piezoresistive MEMS devices

Alexandra Nafari, David Karlén, Cristina Rusu et al
MicroMechanics Europe 2008
Paper in proceedings
2008

Electrostatic feedback for MEMS sensor for in situ TEM instrumentation

Alexandra Nafari, Ning Chang, Johan Angenete et al
Eurosensors 2008
Paper in proceedings
2008

MEMS Sensor for In Situ TEM Atomic Force Microscopy

Alexandra Nafari, David Karlén, Cristina Rusu et al
Journal of Microelectromechanical Systems. Vol. 17 (2), p. 328 - 333
Journal article
2007

MEMS sensor for in situ TEM Atomic Force Microscopy

Alexandra Nafari, David Karlén, Cristina Rusu et al
IEEE 20th International Conference on Micro Electro Mechanical Systems, 2007. MEMS, p. 103-106
Paper in proceedings
2007

Calibration methods of force sensors in the micro-Newton range

Alexandra Nafari, Farzan Alavian Ghavanini, Martin Bring et al
Journal of Micromechanics and Microengineering. Vol. 17 (10), p. 2102-7
Journal article
2006

Resonant mass loading calibration method for nanoindentor force sensor

Alexandra Nafari
Eurosensors XX 2006
Paper in proceedings
2006

In situ TEM nanoindentation using a MEMS force sensor

Alexandra Nafari, Magnus Larsson, Andrey Danilov et al
International Microscopy Congress 16, 2006
Paper in proceedings
2006

Sensors and actuators based on SOI materials

Anke Sanz-Velasco, Alexandra Nafari, Henrik Rödjegård et al
Solid-State Electronics. Vol. 50, p. 865-876
Journal article
2005

Applications of SOI materials to quantum devices and Microsystems

Johan Piscator, Alexandra Nafari, Martin Bring et al
EUROSOI-2005
Paper in proceedings
2005

A micromachined nanoindentation force sensor

Alexandra Nafari, Andrey Danilov, Henrik Rödjegård et al
Sensors and Actuators, A: Physical. Vol. A123-124 (23), p. 44-49
Journal article
2005

Wafer bonding for MEMS

Peter Enoksson, Cristina Rusu, Anke Sanz-Velasco et al
Proceeding of the 9th International Symposium on Semiconductor Wafer Bonding: Science, Technology and Applic, Canadaations, Quebec City
Paper in proceedings
2005

Si-wedge for easy TEM sample preparation for in situ probing

Alexandra Nafari, Peter Enoksson, Håkan Olin
Eurosensors. Vol. XIX, p. WPa32-
Paper in proceedings
2004

A micromachined Nanoindentation force sensor

Alexandra Nafari, Peter Enoksson, Håkan Olin et al
Eurosensors. Vol. XVIII, p. 62-63
Paper in proceedings

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