Combining Scanning Probe Microscopy and Transmission Electron Microscopy
Book chapter, 2011
TEM
TEMSPM
SPM
Author
Alexandra Nafari
Chalmers, Applied Physics, Electronics Material and Systems Laboratory
Johan Angenete
Krister Svensson
Anke Sanz-Velasco
Chalmers, Applied Physics, Electronics Material and Systems Laboratory
Håkan Olin
Scanning Probe Microscopy in Nanoscience and Nanotechnology
59-134
Areas of Advance
Nanoscience and Nanotechnology (2010-2017)
Materials Science
Subject Categories
Materials Engineering
Nano Technology
Other Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
978-3-642-10496-1