Combining Scanning Probe Microscopy and Transmission Electron Microscopy
Book chapter, 2011
TEM
TEMSPM
SPM
Author
Alexandra Nafari
Chalmers, Applied Physics, Electronics Material and Systems
Johan Angenete
Krister Svensson
Anke Sanz-Velasco
Chalmers, Applied Physics, Electronics Material and Systems
Håkan Olin
Scanning Probe Microscopy in Nanoscience and Nanotechnology
59-134
978-3-642-10496-1 (ISBN)
Areas of Advance
Nanoscience and Nanotechnology (SO 2010-2017, EI 2018-)
Materials Science
Subject Categories
Materials Engineering
Nano Technology
Other Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
978-3-642-10496-1