Dielectric response measurements during electrical treeing in sub-picofarad samples
Journal article, 2011
A technique called Arbitrary Waveform Impedance Spectroscopy (AWIS) developed for measuring dielectric properties in insulating materials has been used to study capacitance and dielectric loss changes during electrical tree growth in LDPE samples. The sample capacitance is small, in the range of 0.1–0.15 pF, placing high demands on the measurement system. Simulations in FEM-software show that the measured capacitance is in agreement with simulated values and can be used to estimate tree growth rate. It also seems to be possible to differentiate between different regions of tree growth by analyzing changes in capacitance and loss of the studied samples.
Author
Björn Sonerud
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
Tord Bengtsson
ABB
Jörgen Blennow
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
Stanislaw Gubanski
Chalmers, Materials and Manufacturing Technology, High Voltage Engineering
Susanne Nilsson
Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry
Polymer Testing
0142-9418 (ISSN)
Vol. 30 1 43-49Driving Forces
Innovation and entrepreneurship
Subject Categories
Other Materials Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
Areas of Advance
Materials Science
DOI
10.1016/j.polymertesting.2010.10.004