Dielectric response measurements during electrical treeing in sub-picofarad samples
Artikel i vetenskaplig tidskrift, 2011

A technique called Arbitrary Waveform Impedance Spectroscopy (AWIS) developed for measuring dielectric properties in insulating materials has been used to study capacitance and dielectric loss changes during electrical tree growth in LDPE samples. The sample capacitance is small, in the range of 0.1–0.15 pF, placing high demands on the measurement system. Simulations in FEM-software show that the measured capacitance is in agreement with simulated values and can be used to estimate tree growth rate. It also seems to be possible to differentiate between different regions of tree growth by analyzing changes in capacitance and loss of the studied samples.


Björn Sonerud

Chalmers, Material- och tillverkningsteknik, Högspänningsteknik

Tord Bengtsson

ABB Corporate Research Center

Jörgen Blennow

Chalmers, Material- och tillverkningsteknik, Högspänningsteknik

Stanislaw Gubanski

Chalmers, Material- och tillverkningsteknik, Högspänningsteknik

Susanne Nilsson

Chalmers, Kemi- och bioteknik, Teknisk ytkemi

Polymer Testing

0142-9418 (ISSN)

Vol. 30 43-49


Innovation och entreprenörskap


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Annan elektroteknik och elektronik