Optimization of SiC MESFET for high power and high frequency applications
Paper in proceeding, 2011
Silicon Carbide (SiC)
MESFET
High Power
DC Measurements
High Frequency
High Doped Channel
Small-Signal Measurements
SiC
Author
Niclas Ejebjörk
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Herbert Zirath
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Peder Bergman
Björn Magnusson
Niklas Rorsman
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Materials Science Forum
0255-5476 (ISSN) 16629752 (eISSN)
Vol. 679-680 629-632Areas of Advance
Information and Communication Technology
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.4028/www.scientific.net/MSF.679-680.629