Impact of Eddy Currents and Crowding Effects on High Frequency Losses in Planar Schottky Diodes
Journal article, 2011

In this paper, we present the influence of eddy currents, skin and proximity effects on high-frequency losses in planar terahertz Schottky diodes. The high-frequency losses, particularly losses due to the spreading resistance, are analyzed as a function of the ohmic-contact mesa geometry for frequencies up to 600 GHz. A combination of 3-D electromagnetic (EM) simulations and parameter extraction based on lumped equivalent circuit is used for the analysis. The extracted low-frequency spreading resistance shows a good agreement with the results from electrostatic simulations and experimental data. By taking into consideration the EM field couplings, the analysis shows that the optimum ohmic-contact mesa thickness is approximately one-skin depth at the operating frequency. It is also shown that, for a typical diode, the onset of eddy current loss starts at ∼200 GHz, and the onset of a mixture of skin and proximity effects occurs around ∼400 GHz.

electromagnetic coupling

submillimeter wave devices

skin effect

Schottky diodes

submillimeter wave integrated circuits.

geometric modeling

proximity effect

parameter extraction

eddy current

Current distribution

resistance

Author

Aik-Yean Tang

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

GigaHertz Centre

Jan Stake

GigaHertz Centre

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

IEEE Transactions on Electron Devices

0018-9383 (ISSN)

Vol. 58 10 3260-3269 5970111

Areas of Advance

Information and Communication Technology

Subject Categories

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/TED.2011.2160724

More information

Created

10/6/2017