Impact of Eddy Currents and Crowding Effects on High Frequency Losses in Planar Schottky Diodes
Artikel i vetenskaplig tidskrift, 2011

In this paper, we present the influence of eddy currents, skin and proximity effects on high-frequency losses in planar terahertz Schottky diodes. The high-frequency losses, particularly losses due to the spreading resistance, are analyzed as a function of the ohmic-contact mesa geometry for frequencies up to 600 GHz. A combination of 3-D electromagnetic (EM) simulations and parameter extraction based on lumped equivalent circuit is used for the analysis. The extracted low-frequency spreading resistance shows a good agreement with the results from electrostatic simulations and experimental data. By taking into consideration the EM field couplings, the analysis shows that the optimum ohmic-contact mesa thickness is approximately one-skin depth at the operating frequency. It is also shown that, for a typical diode, the onset of eddy current loss starts at ∼200 GHz, and the onset of a mixture of skin and proximity effects occurs around ∼400 GHz.

electromagnetic coupling

submillimeter wave devices

skin effect

Schottky diodes

submillimeter wave integrated circuits.

geometric modeling

proximity effect

parameter extraction

eddy current

Current distribution



Aik-Yean Tang

Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik


Jan Stake


Chalmers, Mikroteknologi och nanovetenskap, Terahertz- och millimetervågsteknik

IEEE Transactions on Electron Devices

0018-9383 (ISSN)

Vol. 58 10 3260-3269 5970111


Informations- och kommunikationsteknik


Annan elektroteknik och elektronik



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