Harmonic Limited Test Waveform for Fast AWIS Dielectric Studies
Paper in proceedings, 2011

Arbitrary Waveform Impedance Spectroscopy (AWIS) has been designed as a versatile tool for dielectric material studies. Among diverse features, it is capable of determining an entire dielectric spectrum from one measurement, provided the test voltage is rich enough in harmonics. However, extremely harmonic-rich test signals limit the measurement accuracy due to aliasing. Aliasing is caused by the data acquisition if there are harmonics above the Nyquist frequency. However, anti-alias filters, the customary solution, are preferably avoided when using AWIS due to high precision requirements. A remaining possibility is to control the aliasing by limiting the test signal harmonic content. In this paper we present an optimized waveform, which can be applied in situations where the test voltage waveform is not dictated by other requirements. In such cases it enables the use of AWIS for fast dielectric studies under rapidly changing environmental conditions.

AWIS

aliasing

harmonic content

dielectric studies

test waveforms

Author

Xiangdong Xu

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Tord Bengtsson

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Jörgen Blennow

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Stanislaw Gubanski

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

22nd Nordic Insulation Symposium (NORDIS 11), June 13-15, Tampere, Finland

199-202

Driving Forces

Sustainable development

Subject Categories

Other Materials Engineering

Control Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

Areas of Advance

Materials Science

ISBN

978-952-15-2562-9

More information

Created

10/8/2017