Noise and Aliasing Aspects in a Multiharmonic-Dielectric-Response-Measurement System
Paper in proceedings, 2011

Dielectric-response measurements are commonly performed with frequency-domain spectroscopy, polarization/depolarization-current measurements, or return-voltage measurements. These techniques operate in a frequency or time domain, and all have high requirements on the voltage source in order to acquire accurate results. This limits dielectric-response measurements to offline applications. A new technique, which is called arbitrary-waveform- impedance spectroscopy, has been developed, which makes use of the harmonics of any voltage waveform to perform dielectric-response measurements. The technique provides possibilities for online measurements facilitating the monitoring of materials and components in high-voltage applications. Here, the different aspects of the measurement system are presented, including circuit modeling, normalization, and discussions on aliasing and noise; all of them are necessary to control in order to perform accurate measurements. © 2011 IEEE.

Author

Björn Sonerud

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Tord Bengtsson

ABB Corporate Research Center

Jörgen Blennow

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Stanislaw Gubanski

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

IEEE Transactions on Instrumentation and Measurement

0018-9456 (ISSN)

Vol. 60 13 3875-3882

Areas of Advance

Energy

Materials Science

Subject Categories

Control Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/TIM.2011.2147570

More information

Created

10/7/2017