Identification technique of FET model based on vector nonlinear measurements
Journal article, 2011

A new modelling approach which exploits only vector nonlinear measurements is described. The parameters of the I-V and Q-V nonlinear constitutive functions are identified by combining low-and high-frequency large-signal measurements with a numerical optimisation routine. Low-frequency dispersion manifesting in the I-V characteristics is also correctly accounted for. As a case study a gallium nitride HEMT on silicon carbide substrate is considered and very good agreement between measurements and simulation is achieved.

large-signal measurements

extraction

Author

G. Avolio

KU Leuven

D. Schreurs

KU Leuven

A. Raffo

University of Ferrara

G. Crupi

Universita degli Studi di Messina

Iltcho Angelov

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

G. Vannini

University of Ferrara

B. Nauwelaers

KU Leuven

Electronics Letters

0013-5194 (ISSN) 1350-911X (eISSN)

Vol. 47 24 1323-U37

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1049/el.2011.2892

More information

Latest update

5/29/2018